Description: A strong spread to the NNE shows on IN GOD WE TRUST and the nose.
Die Markers:Obverse: Parallel N/S die scratches run through the two dots. Reverse: Numerous light N/S die scratches can be found throughout the reverse. A die clash mark can be seen in the lower left leaves.
Description: Strong extra thickness shows on the date, the designer’s initials, and IN GOD WE TRUST.
Die Markers:Obverse Stage A: A die scratch runs NNW/SSE through the W in WE. Obverse Stage B: Strong die gouge south from the right leg of the R in TRUST. NE/SW die scratches through the designer's initials. Strong crisscrossing die scratches on both sides of the head. Reverse Stage A: None significant. Reverse Stage B: Die clash mark in middle left olive leaves. Strong NW/SE die scratches above EPU.
Submitted By: Stage A: Thomas McGowan, Stage B: Keith Christenson (photos)